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JAEA Reports

Data Compilation for Depth Distribution of Ion-Induced Damage and Ion-Implanted Atoms

*; *; Ozawa, K.

JAERI-M 84-092, 144 Pages, 1984/05

JAERI-M-84-092.pdf:2.61MB

no abstracts in English

Journal Articles

Identification of small point defect clusters by high resolution electron microscopy

; Izui, Kazuhiko

Point Defects and Defect Interactions in Metals, p.705 - 707, 1982/00

no abstracts in English

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